FEI Shows Off New Nano-Microscope
FEI Company, a nanotechnology tools developer, recently introduced the new Nova NanoSEM, a scanning electron microscope. The NanoSEM and its new Helix detector technology (which "combines magnetic immersion lens and low-vacuum SEM technologies for the first time in the history of field emission scanning electron microscopy") is designed to enable non-conductive materials researchers and nano-particle manufacturers to view high resolution images of various nanoscale materials, such as diamond film, polymers, substrates, and other substances needing major visual magnification for observation.
Source: GEEK.comThe microscope was designed using a number of proprietary advances in electron imaging, including custom electron beam techniques and home-grown detection systems. Of course, these are only the tools required to do the research, but eventually advances like this will bring our wild nanotechnology dreams to fruition.
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